Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• formalized choice of the imaging parameters in these modes allows addressing a wide range of formerly challenging tasks – from scanning rough samples with high aspect ratio features to molecular resolution imaging. Keywords: atomic force microscopy; dissipation mode; scanning probe microscopy; vertical mode

• , in turn, limits the successful imaging of complex samples only to experienced researchers. In this article, we would like to draw the attention of AFM practitioners to two operating modes, the vertical mode [2] and the dissipation mode [3][4][5], which can greatly simplify and expand the

• related to changing the scanning procedure itself. Vertical mode The vertical mode (VM) is similar to amplitude modulation, that is, the probe oscillates near the resonant frequency, the driving frequency and power of the piezoelectric transducer are fixed. A key element of VM is a complete decoupling of